HAST Chamber
Description: HAST (Highly Accelerated Stress Test) chambers reduce the time it takes to complete humidity testing for semiconductors. By elevating temperatures above 100°C and increasing the pressure, simulation of normal humidity tests can be made while maintaining the same failure mechanisms. Tests can be completed in days, not weeks.
Application: Suitable to test the moisture capacity of semiconductor packaging.
Testing Standards: IEC 60068-2-66: 1994, IEC 60749-4: 2017, EIAJ ED-4701/100A: 2016, JESD22-A110E: 2021, AEC-Q100-Rev-H: 2014, JPCA-ET08: 2007.
Package: Each set protected with resin fiber and PP film, then put into Strong wooden case with operation manual and video inside.
Delivery: 25-45 days.
Technical Parameters
| Model | SZ-HAST-42 |
| Inner size | φ420×500 (mm) (Dia×Depth) |
| External size | 700×1600×885 (mm) W×H×D |
| Temperature humidity and pressure range | Temperature range +105℃ ～ +150℃ Humidity range 65% ～ 100% RH Pressure range 0～0.4 Mpa（0～4kgf/cm2） The range chart of temperature, humidity and pressure below: (note: the pressure value shown on the chart is absolute pressure)
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| Control accuracy | Temperature resolution: 0.01℃ Temperature deviation: ±1.0℃ Temperature fluctuation: ±0.5℃ Pressure uniformity: ±0.1kg Humidity uniformity: ≤±3%R.H |
| Heating rate | RT → +120℃ ＜80min |
| Structural highlight | This HAST chamber adopts double-container structural design, the test chamber and the steam generator chamber are independent from each other. Compared to a single-container structural design, our machine can provide a more stable and accurate testing environment, allow wider humidity range and prevent the dewing problem.
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| Bias terminals | 20 bias terminals are equipped as standard, can be increased to 200 terminals or more as per individual customer needs |
| Power | 1Φ220VAC±10% 50/60Hz |
