In Aug 25 and 26, China Semiconductor Assembly & Test Conference 2022 was held in Suzhou City Jiangsu Province. This conference brought together the leaders of the semiconductor industry to exchange ideas and learn from each other, share the market and front-line production technology intelligence, and grasp the new trend of future industry development.
We, GAAT, have been invited to showcase our testing instruments to the fellow attendees. We offer a wide range of reliability testing instruments to our semicon customers, including but not limited to the following:
1. TH Temperature & Humidity Test Chamber
2. TCT Temperature Cyclic Test Chamber
3. TC Fast Rate Temperature Cyclic Test Chamber
4. TST Thermal Shock Test Chamber
5. HTST High Temperature Storage Test Chamber
6. HAST Highly Accelerated Stress Test Chamber
7. PCT Pressure Cooker Test Chamber
8. BI Burn In Oven Chamber
It presents a great opportunity to meet with our existing customers and approach potential customers.
